RUANGPHAIT, A.; KERDPRADIST, A.; MUANGHLUA*, R.; WONGPRASERT, Y. Gamma-radiation Induced Degradation of the Electrical Characteristics of NMOSFETs. CURRENT APPLIED SCIENCE AND TECHNOLOGY, Bangkok, Thailand, v. 22, n. 3, p. DOI: 10.55003/cast.2022.03.22.004 (7 pages), 2021. DOI: 10.55003/cast.2022.03.22.004. Disponível em: https://li01.tci-thaijo.org/index.php/cast/article/view/252060. Acesso em: 16 sep. 2026.