SAKUNA, N.; MUANGHLUA, R.; NIEMCHAROEN*, S.; RUANGPHANIT, A. The Effect of Temperature on Threshold Voltage, The Low Field Mobilty and the Series Parasitic Resistance of PMOSFET. CURRENT APPLIED SCIENCE AND TECHNOLOGY, Bangkok, Thailand, v. 13, n. 1, p. 9–16, 2018. Disponível em: https://li01.tci-thaijo.org/index.php/cast/article/view/135096. Acesso em: 26 aug. 2026.