Ruangphait, A., Kerdpradist, A., Muanghlua*, R. and Wongprasert, Y. (2021) “Gamma-radiation Induced Degradation of the Electrical Characteristics of NMOSFETs”, CURRENT APPLIED SCIENCE AND TECHNOLOGY. Bangkok, Thailand, 22(3), p. DOI: 10.55003/cast.2022.03.22.004 (7 pages). doi: 10.55003/cast.2022.03.22.004.