A. Ruangphait, A. Kerdpradist, R. Muanghlua*, and Y. Wongprasert, “Gamma-radiation Induced Degradation of the Electrical Characteristics of NMOSFETs”, Curr. Appl. Sci. Technol., vol. 22, no. 3, p. DOI: 10.55003/cast.2022.03.22.004 (7 pages), Sep. 2021.