Ruangphait, Anucha, Amonrat Kerdpradist, Rangson Muanghlua*, and Yothin Wongprasert. “Gamma-radiation Induced Degradation of the Electrical Characteristics of NMOSFETs”. CURRENT APPLIED SCIENCE AND TECHNOLOGY 22, no. 3 (September 1, 2021): DOI: 10.55003/cast.2022.03.22.004 (7 pages). accessed September 4, 2026. https://li01.tci-thaijo.org/index.php/cast/article/view/252060.