Ruangphait A, Kerdpradist A, Muanghlua* R, Wongprasert Y. Gamma-radiation Induced Degradation of the Electrical Characteristics of NMOSFETs. Curr. Appl. Sci. Technol. [internet]. 2021 Sep. 1 [cited 2026 Sep. 11];22(3):DOI: 10.55003/cast.2022.03.22.004 (7 pages). available from: https://li01.tci-thaijo.org/index.php/cast/article/view/252060