PECOVSKA-GJORGJEVICH, M.; VELEVSKA, J.; ATANASSOVA, E. Behavior of Ta2O5-Si Capacitors with Different Gate Electrode under Constant Current Stress. Science, Engineering and Health Studies, [S. l.], v. 6, n. 2, p. 37–48, 2013. DOI: 10.14456/sustj.2012.8. Disponível em: https://li01.tci-thaijo.org/index.php/sehs/article/view/7455. Acesso em: 1 may. 2024.