Pecovska-Gjorgjevich M, Velevska J, Atanassova E. Behavior of Ta2O5-Si Capacitors with Different Gate Electrode under Constant Current Stress. SEHS [Internet]. 2013 Mar. 24 [cited 2024 May 2];6(2):37-48. Available from: https://li01.tci-thaijo.org/index.php/sehs/article/view/7455