Leaf Area Estimation Models for Five Cultivars of Bananas from Linear Measurements

Abstract

A non-destructive, rapid and precise method for leaf area assessment in five commercial  cultivars of banana in Thailand namely Namwa (ABB), Leb Mu Nang (AA), Khai (AA), Hom Thong (AAA) and Grand Nain (AAA) was studied and developed from linear regression models at Suratthani Horticulture Research Center during 2002-2003. A close relationship existed between leat area (LA) and various combinations of leaf length (L) and width (W) in all cultivars. Leat area could be estimated  precisely with the regression models as followed:A non-destructive, rapid and precise method for leaf area assessment in five commercial  cultivars of banana in Thailand namely Namwa (ABB), Leb Mu Nang (AA), Khai (AA), Hom Thong (AAA) and Grand Nain (AAA) was studied and developed from linear regression models at Suratthani Horticulture Research Center during 2002-2003. A close relationship existed between leat area (LA) and various combinations of leaf length (L) and width (W) in all cultivars. Leat area could be estimated  precisely with the regression models as followed:     (1) Namwa LA =       0.019 + 0.955 (±0.025) L x W r² = 0.971     (2) Leb Mu Nang LA =     - 0.009 + 0.840 (±0.008) L x W r² = 0.992     (3) Khai LA =     - 0.037 + 0.923 (±0.016) L x W r² = 0.987     (4) Hom Tong LA =     - 0.008 + 0.877 (±0.014) L x W r² = 0.987     (5) Grand Nain LA =     - 0.004 + 0.862 (±0.036) L x W r² = 0.930